Anton Paar SurPASS, made in German
Electro-Kinetic Analyzer (EKA)
The instrument is used for measuring the zeta-potential of bulk
materials. This zeta-potential is important to predict the stability
if colloidal suspensions and the tendency to agglomerate.
the main body is about 2M and the total (including cells) is about 2.7M

Brookhaven 90Plus/ZetaPALS, made in US
Dynamic Light Scattering (DLS)
http://www.bic.com/90Plus.html
http://www.bic.com/ZetaPALS.html
Based on the dynamic light scattering (DLS), this instrument can be
used to determine the particle size and its zeta-potential. Comparing
with the electro-kinetic analyzer (EKA) like the SurPASS, this
instrument is mainly for nano materials. Comparing with observing the
particle size directly with electron microscopes, DLS is quick and
non-destructive.
this is about 2M

PHI VersaProbe XPS Microprobe, made in Japan
X-ray Photoelectron Spectrometry (XPS), a.k.a. Electron Spectroscopy
for Chemical Analysis (ESCA)

In a ultra-high vacuum (UHV) chamber (1E-10 torr), photoelectrons are
excited with X-ray. As the escape depth is shallow, the information
came from the top few nm. The is important in studying the out-most
chemical composition and chemical structure of materials. Combine the
the sputtering gun (Ar and/or C60), one can slowly remove the surface
and profile the depth.
about 24M

FEI Nova200 NanoSEM, made in US
Scanning Electron Microscope (SEM)
Using a electron beam, surface structure can be observed directly with
non-conducting samples can also be observed with ~nm resolution.
Combine with the X-ray Energy Dispersive Spectroscopy (XEDS) made by
EDAX (US )
the chemical composition can also be determined.
the SEM itself is about 10M and 1.5M for other detectors. EDAX is about 2M.

LEO 1530, made in US
This is similar to D but without low-vacuum mode and XEDS. However,
it is converted to electron beam lithography (EBL) platform.
(I did not purches this one so that I am not sure about the price - it
would be about 10M in total)

JEOL JEM-2100F, made in Japan
Transmission Electron Microscope (TEM)
The high-resolution electron microscope (HREM) has a resolution about
angstrom. Atomic arrangements can be observed directly with this
instrument.
The system is about 20M in total.

HP Blade System, made in US
This is for high-performance computing. The main system consists with
48 computing nodes. Each node has two dual-core 3GHz Woodcrest CPU
and 4-16Gb memory.
7.5M